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HDI 4W AET
Designed for HDI boards with fine line routing, micro vias, and multi layer stacks. Ideal for smartphones, tablets, wearables and other high speed, high frequency products.
Key Features:
• High Speed Measurement – Utilises the Flash™ 3rd generation measurement engine; each point is tested in an ultra short cycle, dramatically accelerating the overall test flow.
• Clamp (4–8 interchangeable claws) – Provides controllable gripping force and micron level positioning, protecting ultra thin substrates while offering the flexibility to adapt to different board sizes.
• Breakdown Detection – Independent high speed measurement channel delivers real time, predictive breakdown detect, capable of catching high voltage layer to layer shorts and micro opens.
• AOI Electrical Test Integration – Built in AOIn™ image engine provides automatic alignment and rapid calibration, cutting fixture setup time dramatically.
Typical Applications:
• Multi layer HDI boards for smartphones, tablets, wearables
• Miniature antennas, optical communication links, high frequency/high speed transmission lines
• Any high density interconnect product that requires precise four wire testing
Customer Benefits:
• Very fast test cycles; fully automated flow reduces overall test time
• Micron level positioning and stable gripping improve test reliability
• Immediate predictive alerts help catch potential failures early
• Integrated AOI electrical testing lowers labor costs and shortens fixture adjustment time
CSP 4W AET
Specifically engineered for Chip Scale Packages (CSP). Provides a complete verification flow for ultra dense pins and miniature package formats.
Key Features:
• Synchronous Measurement – Flash™ 3rd generation engine can acquire up to eight test lines simultaneously, increasing throughput.
• Breakdown Detection – Embedded voltage step and slope analysis not only detects breakdown instantly but also grades the severity of the fault.
• Real Time Pin Damage Inspection – AOIn™ vision technology identifies pin scratches or other defects during testing, reducing rework.
• AOI Electrical Test Integration – Automatic alignment and fast calibration substantially shorten fixture adjustment time.
Typical Applications:
• CSP devices for smartphones, IoT sensor modules, automotive cameras, etc.
• High speed data transfer chips that need batch testing and verification
Customer Benefits:
• Multi channel synchronous testing greatly boosts production capacity
• Accurate breakdown grading enhances yield and reliability
• Real time damage detection lowers rework expenses
• AOI electrical integration reduces fixture setup time and manual labor
Fixture Probe AOIM
Fixture Probe AOIM is an innovatively designed automatic optical inspection system. It is an indispensable member of the electrical testing solution that introduces AOI information. It integrates precision-designed mechanisms and advanced optical technology, and is assembled and produced under strictly controlled standards. It can help achieve simpler, faster, and more effective electrical testing.
Using innovative comparison detection logic, it conducts comprehensive quality inspection on each needle on the fixture, and can detect defects such as missing needles, deformation needles, and foreign objects. At the same time, it provides offset information to help reduce the ineffective time waste of electrical testing machine adjustment.
In addition to inspecting fixtures, it also has the function of detecting punctures on the entire board of the circuit board. It can perform first-piece inspection before mass production of the electrical testing machine to ensure that the electrical testing machine is set correctly, and it can also perform circuit board sampling during mass production to achieve effective quality control.
